发明名称 光リフレクトメトリ測定方法及び光リフレクトメトリ測定装置
摘要 <p><P>PROBLEM TO BE SOLVED: To measure a relatively highly reliable birefringence distribution and further PMD distribution even when the polarization characteristic of an object to be measured changes with time by an external environmental influence or the like. <P>SOLUTION: In optical reflectometry measurement, by concurrently making two types of incident light having different polarization states incident into an object to be measured, a polarization state of back-scattered light relative to each incident light is concurrently measured and the birefringence distribution of the object to be measured from the result is calculated. Further, the longitudinal distribution of polarization mode dispersion (PMD) is calculated from the obtained birefringence distribution. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP5641178(B2) 申请公布日期 2014.12.17
申请号 JP20090169162 申请日期 2009.07.17
申请人 发明人
分类号 G01M11/02;G01M11/00;G01N21/23 主分类号 G01M11/02
代理机构 代理人
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