发明名称 Diagnostic device
摘要 A diagnostic device detects a fault and estimates its cause based on the degree of change of a plurality of attributes of data measured from an object being diagnosed. A diagnostic object change degree pattern generation unit 110 calculates the degree of change of each attribute of data, including a plurality of attributes of the object being diagnosed measured from the object being diagnosed to generate a diagnostic object change degree pattern which is a combination of values of the degree of change of the respective attributes. A criterion change degree pattern memory 150 holds in store a criterion change degree pattern, formed of a pattern of values of the degree of change of the attributes of data measured from the object being diagnosed, in association with event(s)-to-be-diagnosed on the fault sort basis or on the fault cause basis. A change degree pattern diagnosis means 120 effects pattern matching between the diagnostic object change degree pattern and the criterion change degree pattern in the criterion change degree pattern memory to diagnose the object being diagnosed.
申请公布号 EP2813913(A1) 申请公布日期 2014.12.17
申请号 EP20140183515 申请日期 2008.03.21
申请人 NEC CORPORATION 发明人 FUJIMAKI, RYOHEI;NAKATA, TAKAYUKI;SATOU, AKINORI;TSUKAHARA, HIDENORI
分类号 G01M99/00;G05B23/02;G06F17/30 主分类号 G01M99/00
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