Method to detect poor infrared rays, Microchip that is able to detect poor infrared rays and apparatus working with these microchips

摘要

The invention relates to a method for the detection of poor rays of infrared wavelength, to a microchip that is able to detect poor infrared rays and to an apparatus working with these microchips. The invention gives a possibility to detect and to locate little growings cancers and others hidden places of parts of a machine with increased temperature. The invention does do it with a special microchip which is able to change photons in electrons. This microchip of the invention consists of a plate of glas or an other insulating material with a rough surface on the one side. The front surface of this plate is rough by a plurality of blind holes, the ground of each of theese blind holes is covered with a thin layer of metal, in each of the blind holes are located little crystals of a kind of material that emitts one or more electrons by each hit of an infrared light beam, the surface of this plate and the blind holes are covered with a net of very thin wires and the active part of this net of very thin wires has on its ends rails of metal to collect and transmit the electrons to a measuring instrument.