发明名称 |
Electron beam focusing electrode and electron gun using the same |
摘要 |
An electron beam focusing electrode and an electron gun using the same may include a plate having a polygonal through-hole; at least a projecting portion formed on at least one side of the through-hole. By using the electron beam focusing electrode, a spreading phenomenon of an electron beam having a rectangular cross section may be reduced. Further, the output of the electron gun may be increased, and electron beams may be easily focused. |
申请公布号 |
US8912505(B2) |
申请公布日期 |
2014.12.16 |
申请号 |
US201213644890 |
申请日期 |
2012.10.04 |
申请人 |
Samsung Electronics Co., Ltd.;Seoul National University Industry Foundation |
发明人 |
Baik Chan Wook;Srivastava Anurag;Kim Jong Min;Kim Sun Il;Son Young Mok;Park Gun Sik;So Jin Kyu |
分类号 |
G21K5/04;H01J1/46;H01J1/13;G21K1/087;H01J1/30 |
主分类号 |
G21K5/04 |
代理机构 |
Harness, Dickey & Pierce, P.L.C. |
代理人 |
Harness, Dickey & Pierce, P.L.C. |
主权项 |
1. An electron beam focusing electrode, comprising:
a focusing plate having a polygonal through-hole and configured to receive an applied voltage; and a projecting portion formed on at least one side of the through-hole. |
地址 |
Gyeonggi-do KR |