Test contact system for testing integrated circuits with packages having an array of signal and power contacts

摘要

A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120).

主权项

1. A test receptacle for making temporary electrical contact with a plurality of microcircuit terminals to a load board, said terminals having a predetermined pattern, comprising:
a test contact element array comprising a plurality of test contact elements arranged in substantially the predetermined pattern of the plurality of microcircuit terminals, each test contact element in the plurality comprising a resilient finger projecting from an insulating membrane as a cantilevered beam, and having on a contact side thereof a conducting contact pad for contacting a corresponding microcircuit terminal in the plurality; a spring members applying a bias force to said test contact elements and extending; a plurality of flexible connection vias arranged adjacent said spring members and electrically connected to said test contact elements at one and to a load board at the other in substantially the predetermined pattern of the plurality of microcircuit terminals, each connection via in the plurality aligned with one of the test contact elements.