发明名称 Electrostatic shielding technique on high voltage diodes
摘要 A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.
申请公布号 US8912803(B2) 申请公布日期 2014.12.16
申请号 US201113235808 申请日期 2011.09.19
申请人 Honeywell International, Inc. 发明人 Mogaveera Vasu
分类号 G01R1/067;H01R11/18 主分类号 G01R1/067
代理机构 Wood, Phillips, Katz, Clark & Mortimer 代理人 Wood, Phillips, Katz, Clark & Mortimer
主权项 1. A DC high potential testing meter comprising: a first probe comprising an insulated shield supporting an electrode extending from a distal end of the shield, a high voltage resistor and a high voltage diode in the shield connected in series with the electrode, and a capacitance, formed by a metallic collar, across the high voltage diode to provide uniform voltage distribution along the high voltage diode; a second probe comprising an insulated shield supporting an electrode extending from a distal end of the shield and a high voltage resistor connected in series with the electrode; and a meter operatively connected to the first and second probes comprising a housing enclosing an electrical circuit for measuring voltage across the electrodes and providing an output representing measured voltage.
地址 Morristown NJ US
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