发明名称 |
Electrostatic shielding technique on high voltage diodes |
摘要 |
A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage. |
申请公布号 |
US8912803(B2) |
申请公布日期 |
2014.12.16 |
申请号 |
US201113235808 |
申请日期 |
2011.09.19 |
申请人 |
Honeywell International, Inc. |
发明人 |
Mogaveera Vasu |
分类号 |
G01R1/067;H01R11/18 |
主分类号 |
G01R1/067 |
代理机构 |
Wood, Phillips, Katz, Clark & Mortimer |
代理人 |
Wood, Phillips, Katz, Clark & Mortimer |
主权项 |
1. A DC high potential testing meter comprising:
a first probe comprising an insulated shield supporting an electrode extending from a distal end of the shield, a high voltage resistor and a high voltage diode in the shield connected in series with the electrode, and a capacitance, formed by a metallic collar, across the high voltage diode to provide uniform voltage distribution along the high voltage diode; a second probe comprising an insulated shield supporting an electrode extending from a distal end of the shield and a high voltage resistor connected in series with the electrode; and a meter operatively connected to the first and second probes comprising a housing enclosing an electrical circuit for measuring voltage across the electrodes and providing an output representing measured voltage. |
地址 |
Morristown NJ US |