发明名称 Lateral double-diffused high voltage device
摘要 A method of forming a device is disclosed. The method includes providing a substrate with a device region. The method also includes forming a transistor in the device region. The transistor includes a gate having first and second sides along a gate direction. The transistor also includes a first doped region adjacent to a first side of the gate, a second doped region adjacent to a second side of the gate, and a channel under the gate. The transistor further includes a channel trench in the channel of the gate, wherein the channel trench is along a trench direction which is at an angle θ other than 90° with respect to the gate direction.
申请公布号 US8912066(B2) 申请公布日期 2014.12.16
申请号 US201313831981 申请日期 2013.03.15
申请人 GLOBALFOUNDRIES Singapore Pte. Ltd. 发明人 Zhang Guowei;Verma Purakh Raj
分类号 H01L21/336;H01L29/78;H01L29/66 主分类号 H01L21/336
代理机构 Horizon IP Pte. Ltd. 代理人 Horizon IP Pte. Ltd.
主权项 1. A method of forming a device comprising: providing a substrate with a device region; and forming a transistor in the device region, wherein the transistor includes a gate trench,a gate disposed on the substrate and fills the gate trench, the gate having first and second sides along a gate direction,a first doped region adjacent to a first side of the gate,a second doped region adjacent to a second side of the gate,a channel under the gate,wherein the channel is along a gate trench direction which is at an angle θ other than 90° with respect to the gate direction, andan internal device isolation region along the trench direction in the substrate between the gate and the second doped region.
地址 Singapore SG