发明名称 CMP SLURRY COMPOSITION FOR SILICONE WAFER AND POLISHING METHOD USING THE SAME
摘要 <p>The present invention relates to a CMP slurry composition for polishing a silicon wafer, comprising deionized water, an abrasive, a water-soluble polymer, an acetic acid-based chelating agent, a phosphoric acid-based chelating agent, and a pH adjuster. The CMP slurry composition shows excellent polishing effect on a silicon wafer in the second polishing to polish mirror surfaces after the first polishing and has little defect after polishing the mirror surfaces.</p>
申请公布号 KR20140143058(A) 申请公布日期 2014.12.15
申请号 KR20130065012 申请日期 2013.06.05
申请人 CHEIL INDUSTRIES INC. 发明人 KIM, TAE WAN;JUNG, YOUNG CHUL;KANG, DONG HUN
分类号 C09K3/14;H01L21/304 主分类号 C09K3/14
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