| 摘要 |
PROBLEM TO BE SOLVED: To provide a tester capable of easily and appropriately testing various types of test target devices.SOLUTION: A server 300 stores therein a plurality of configuration data 306_1 to 306_3 for providing different functions to a test system 2. Tester hardware 100 is configured so as to make at least a part of the functions variable according to the configuration data 306_1 to 306_3 stored in a nonvolatile memory 102 of the tester hardware 100. A control program 302 is installed to an information processing apparatus 200. The information processing apparatus 200 is provided, from the control program 302, with (i) a function to display candidates of the plurality of configuration data 306 on a display at a time of setting up the test system 2, and (ii) a function to write user's selected configuration data to the nonvolatile memory 102 of the tester hardware 100. |
