发明名称 TEST MEASUREMENT APPARATUS, AND IMAGE GENERATING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To enable one part of spectral display to be shown on an enlarged scale.SOLUTION: A test measurement apparatus 500 comprises a bitmap processor 510 that generates a first bitmap image from input test signals, a user interface 502 for specifying one part of the first bitmap image and a second bitmap processor 550 so configured as to generate a second bitmap image from the specified part of the first bitmap image. The second bitmap image is an enlarged image of the specified part of the first bitmap image, and the first and second bitmap images are so corrected as to be consistent on a time scale.</p>
申请公布号 JP2014235150(A) 申请公布日期 2014.12.15
申请号 JP20130118843 申请日期 2013.06.05
申请人 TEKTRONIX INC 发明人 EARLS JEFFREY D;BORDEN FRANKLIN M;KELLY F GARRISON
分类号 G01R23/16;G01R23/173 主分类号 G01R23/16
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