发明名称 SURFACE STATE MEASUREMENT METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a surface state measurement method capable of accurately detecting a surface state of a measurement object.SOLUTION: Before measurement (steps S5-S8) of a measurement area of a sun gear, a focal position of a lens is matched on an optimum position. When adjusting the focal position of the lens, an operator sticks a focus confirmation plate to the measurement area, and images a base end surface of an infrared radiation fiber cable by an infrared radiation camera, and while viewing a monitor of a display device, makes a tip end part of the infrared radiation fiber cable come close to or separate from the measurement area of the sun gear (step S4).</p>
申请公布号 JP2014235097(A) 申请公布日期 2014.12.15
申请号 JP20130117195 申请日期 2013.06.03
申请人 JTEKT CORP 发明人 SAWADA NAOKI;KIJI MASAHIRO;YAMADA KAZUAKI
分类号 G01L1/00 主分类号 G01L1/00
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