发明名称 PROCESS FOR PRODUCING AT LEAST ONE THROUGH-SILICON VIA WITH IMPROVED HEAT DISSIPATION, AND CORRESPONDING THREE-DIMENSIONAL INTEGRATED STRUCTURE
摘要 A method for producing at least one through-silicon via inside a substrate may include forming a cavity in the substrate from a first side of the substrate until an electrically conductive portion is emerged onto. The method may also include forming an electrically conductive layer at a bottom and on walls of the cavity, and at least partly on a first side outside the cavity. The process may further include at least partially filling the cavity with at least one phase-change material. Another aspect is directed to a three-dimensional integrated structure.
申请公布号 US2014361440(A1) 申请公布日期 2014.12.11
申请号 US201414287343 申请日期 2014.05.27
申请人 STMicroelectronics SA ;STMicroelectronics (Crolles 2) SAS 发明人 BAR PIERRE;GOUSSEAU Simon;BEILLIARD Yann
分类号 H01L23/373;H01L23/48;H01L21/768 主分类号 H01L23/373
代理机构 代理人
主权项
地址 Montrouge FR