发明名称 METHOD OF DETECTING FAULTS OF OPERATION RECIPES IN A WIRE BONDING MACHINE AND APPARATUS FOR PERFORMING THE SAME
摘要 According to a method of detecting a fault of an operation condition in a wire bonding machine, individual bond parameters with respect to each of the operation algorithms of the wire bonding machine are set based on design data including information with respect to conductive wires connected between semiconductor chips of a semiconductor package. Actual conductive wires of an actual semiconductor package are formed using the wire bonding machine into which the design data can be inputted. Actual data with respect to actual operation algorithms of the wire bonding machine, which can form the actual conductive wires, can be obtained. The actual data can be compared with the individual bond parameters to detect the faults of the operation algorithms of the wire bonding machine. Thus, forming an abnormal conductive wire by the wire bonding machine can be prevented beforehand.
申请公布号 KR20140141993(A) 申请公布日期 2014.12.11
申请号 KR20130063471 申请日期 2013.06.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, MIN;YOU, YEAN SANG;HAN, WON GIL;KIM, HO AM;KIM, BYONG JOO;LEE, DO HOON
分类号 H01L21/60;H01L21/66 主分类号 H01L21/60
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