发明名称 MICROFLUIDIC DEVICE, TEST APPARATUS, TEST SYSTEM HAVING THE SAME AND CONTROL METHOD FOR THE TEST APPARATUS
摘要 A test apparatus is provided for rapidly detecting abnormal loading of a microfluidic device, and unloading the abnormally-loaded microfluidic device, thereby preventing contamination of the test apparatus by a sample and degradation in reliability of test results. A test system including the test apparatus and a control method for the test apparatus are also provided. The test apparatus includes an optical sensor to photograph an image at a position corresponding to the microfluidic device, and a controller to detect a pattern formed on a surface of the microfluidic device based on the photographed image to determine whether characteristics of the detected pattern are identical to characteristics of a pre-stored pattern, and to determine whether the microfluidic device has not been normally loaded, when the characteristics of the detected pattern are different from the characteristics of the pre-stored pattern.
申请公布号 US2014363895(A1) 申请公布日期 2014.12.11
申请号 US201313930772 申请日期 2013.06.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE Jung Tae;KIM Chung Ung;LEE Young Goun;HONG Jin Beom
分类号 G01N21/01 主分类号 G01N21/01
代理机构 代理人
主权项 1. A test apparatus for testing a sample received in a microfluidic device, comprising: an optical sensor configured to photograph an image at a position corresponding to the microfluidic device; and a controller configured to detect a pattern formed on a surface of the microfluidic device based on the photographed image, and to determine whether characteristics of the detected pattern are identical to characteristics of a pre-stored pattern, and to determine that the microfluidic device has not been normally loaded, when the characteristics of the detected pattern are different from the characteristics of the pre-stored pattern.
地址 Suwon-si KR