发明名称 |
MICROFLUIDIC DEVICE, TEST APPARATUS, TEST SYSTEM HAVING THE SAME AND CONTROL METHOD FOR THE TEST APPARATUS |
摘要 |
A test apparatus is provided for rapidly detecting abnormal loading of a microfluidic device, and unloading the abnormally-loaded microfluidic device, thereby preventing contamination of the test apparatus by a sample and degradation in reliability of test results. A test system including the test apparatus and a control method for the test apparatus are also provided. The test apparatus includes an optical sensor to photograph an image at a position corresponding to the microfluidic device, and a controller to detect a pattern formed on a surface of the microfluidic device based on the photographed image to determine whether characteristics of the detected pattern are identical to characteristics of a pre-stored pattern, and to determine whether the microfluidic device has not been normally loaded, when the characteristics of the detected pattern are different from the characteristics of the pre-stored pattern. |
申请公布号 |
US2014363895(A1) |
申请公布日期 |
2014.12.11 |
申请号 |
US201313930772 |
申请日期 |
2013.06.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE Jung Tae;KIM Chung Ung;LEE Young Goun;HONG Jin Beom |
分类号 |
G01N21/01 |
主分类号 |
G01N21/01 |
代理机构 |
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代理人 |
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主权项 |
1. A test apparatus for testing a sample received in a microfluidic device, comprising:
an optical sensor configured to photograph an image at a position corresponding to the microfluidic device; and a controller configured to detect a pattern formed on a surface of the microfluidic device based on the photographed image, and to determine whether characteristics of the detected pattern are identical to characteristics of a pre-stored pattern, and to determine that the microfluidic device has not been normally loaded, when the characteristics of the detected pattern are different from the characteristics of the pre-stored pattern. |
地址 |
Suwon-si KR |