发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 This silicon carbide semiconductor device is provided with a vertical MOSFET including: a semiconductor substrate having a high-concentration impurity layer (1) and a drift layer (2); a base region (3); a source region (4); a trench gate structure; a source electrode (9); and a drain electrode (10). In the base region, a high-concentration base region (3a) and a low-concentration base region (3b) having a lower second conductivity-type impurity concentration than the high-concentration base region are laminated. The high-concentration base region and the low-concentration base region are in contact with the side surfaces of the trench.
申请公布号 WO2014196164(A1) 申请公布日期 2014.12.11
申请号 WO2014JP02812 申请日期 2014.05.28
申请人 DENSO CORPORATION 发明人 TAKEUCHI, YUICHI;SUZUKI, NAOHIRO;MORIMOTO, JUN;SOEJIMA, NARUMASA
分类号 H01L29/78;H01L21/336;H01L29/06;H01L29/12 主分类号 H01L29/78
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