| 发明名称 |
SEMICONDUCTOR CHIP TEST DEVICE AND METHOD |
| 摘要 |
<p>The present invention relates to a semiconductor chip testing device and a semiconductor chip testing method. The semiconductor chip testing device according to the present invention comprises: a semiconductor chip testing socket which is connected to a terminal of a semiconductor chip; a film guide which guides the terminal of the semiconductor chip; and a guide support unit on which the film guide is disposed.</p> |
| 申请公布号 |
KR20140141881(A) |
申请公布日期 |
2014.12.11 |
| 申请号 |
KR20130063116 |
申请日期 |
2013.05.31 |
| 申请人 |
SHIN, JONG CHEON |
发明人 |
SHIN, JONG CHEON;HA, DONG HO |
| 分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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