发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR ACCESSING THE SAME
摘要 A semiconductor memory device and a method for accessing the same are disclosed. The semiconductor memory device comprises a memory transistor, a first control transistor and a second control transistor, wherein a source electrode and a gate electrode of the first control transistor are coupled to a first bit line and a first word line respectively, a drain electrode and a gate electrode of the second control transistor are coupled to a second word line and a second bit line respectively, a gate electrode of the memory transistor is coupled to a drain electrode of the first control transistor, a drain electrode of the memory transistor is coupled to a source electrode of the second control transistor, and a source electrode of the memory transistor is coupled to ground, and wherein the memory transistor exhibits a gate electrode-controlled memory characteristic. The semiconductor memory device increases integration level and decreases refresh frequency.
申请公布号 US2014362652(A1) 申请公布日期 2014.12.11
申请号 US201214355120 申请日期 2012.03.22
申请人 Luo Zhijiong;Zhu Zhengyong;Yin Haizhou;Zhu Huilong 发明人 Luo Zhijiong;Zhu Zhengyong;Yin Haizhou;Zhu Huilong
分类号 H01L27/105;H01L29/267;G11C7/00;H01L29/786 主分类号 H01L27/105
代理机构 代理人
主权项 1. A semiconductor memory device, comprising a memory transistor, a first control transistor and a second control transistor, wherein a source electrode and a gate electrode of the first control transistor are coupled to a first bit line and a first word line respectively, a drain electrode and a gate electrode of the second control transistor are coupled to a second word line and a second bit line respectively, a gate electrode of the memory transistor is coupled to a drain electrode of the first control transistor, a drain electrode of the memory transistor is coupled to a source electrode of the second control transistor, and a source electrode of the memory transistor is coupled to ground, and wherein the memory transistor exhibits a gate electrode-controlled memory characteristic.
地址 Poughkeepsie NY US
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