发明名称 GaN Substrate, Semiconductor Device and Method for Fabricating GaN Substrate and Semiconductor Device
摘要 A gallium nitride (GaN) substrate, a semiconductor device, and methods for fabricating a GaN substrate and a semiconductor device are provided. The GaN substrate includes: a GaN base; an aluminum gallium nitride (AlGaN) layer, disposed on the GaN base; and a p-type conducting layer disposed on an active area of the AlGaN layer, and used to exhaust surface state negative electrons on the AlGaN layer and neutralize a dangling bond on the AlGaN layer. The p-type conducting layer is formed on the AlGaN layer, and a hole charge carrier in the p-type conducting layer can be used to exhaust the surface state negative electrons on an n-type AlGaN layer, neutralize the dangling bond on a section of the AlGaN layer, and prevent the forming of a virtual gate, so as to suppress a current collapse effect of the semiconductor device fabricated using the GaN substrate.
申请公布号 US2014361311(A1) 申请公布日期 2014.12.11
申请号 US201414466295 申请日期 2014.08.22
申请人 Huawei Technologies Co., Ltd. 发明人 Zhang Zhenghai;Zhang Zongmin;Cao Bocheng
分类号 H01L29/778;H01L29/205;H01L21/02;H01L29/20 主分类号 H01L29/778
代理机构 代理人
主权项 1. A gallium nitride (GaN) substrate, comprising: a GaN base; an aluminium gallium nitride (AlGaN) layer disposed on the GaN base; and a p-type conducting layer disposed on an active area of the AlGaN layer, wherein the p-type conducting layer is configured to exhaust surface state negative electrons on the AlGaN layer and neutralize a dangling bond on the AlGaN layer.
地址 Shenzhen CN