发明名称 ETCHING METHOD, ETCHANT AND ETCHANT KIT USED FOR THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE PRODUCT
摘要 PROBLEM TO BE SOLVED: To provide an etching method capable of selectively removing a layer containing a specific metal from a layer containing Ge, an etchant and an etchant kit used for the same, and a method for manufacturing a semiconductor substrate product.SOLUTION: An etching method for selectively removing a second layer from a semiconductor substrate which has a first layer containing germanium (Ge) and the second layer containing at least one kind of a specific metal element selected from nickel-platinum (NiPt), titanium (Ti), nickel (Ni) and cobalt (Co), and being a semiconductor substrate etching method for removing the second layer by contacting the second layer with an etchant containing alkali compound.
申请公布号 JP2014232874(A) 申请公布日期 2014.12.11
申请号 JP20140094839 申请日期 2014.05.01
申请人 FUJIFILM CORP 发明人 KAMIMURA TETSUYA;KOYAMA AKIKO;TAKAHASHI TOMOMI;MIZUTANI ATSUSHI;SUGISHIMA YASUO
分类号 H01L21/308;C23F1/38;C23F1/40;H01L21/28;H01L21/306;H01L21/336;H01L21/8234;H01L27/088;H01L29/417;H01L29/78 主分类号 H01L21/308
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