发明名称 |
ETCHING METHOD, ETCHANT AND ETCHANT KIT USED FOR THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE PRODUCT |
摘要 |
PROBLEM TO BE SOLVED: To provide an etching method capable of selectively removing a layer containing a specific metal from a layer containing Ge, an etchant and an etchant kit used for the same, and a method for manufacturing a semiconductor substrate product.SOLUTION: An etching method for selectively removing a second layer from a semiconductor substrate which has a first layer containing germanium (Ge) and the second layer containing at least one kind of a specific metal element selected from nickel-platinum (NiPt), titanium (Ti), nickel (Ni) and cobalt (Co), and being a semiconductor substrate etching method for removing the second layer by contacting the second layer with an etchant containing alkali compound. |
申请公布号 |
JP2014232874(A) |
申请公布日期 |
2014.12.11 |
申请号 |
JP20140094839 |
申请日期 |
2014.05.01 |
申请人 |
FUJIFILM CORP |
发明人 |
KAMIMURA TETSUYA;KOYAMA AKIKO;TAKAHASHI TOMOMI;MIZUTANI ATSUSHI;SUGISHIMA YASUO |
分类号 |
H01L21/308;C23F1/38;C23F1/40;H01L21/28;H01L21/306;H01L21/336;H01L21/8234;H01L27/088;H01L29/417;H01L29/78 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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