发明名称 ION DOSE MEASURING DEVICE FOR PLASMA IMMERSION ION IMPLANTATION
摘要 <p>The present invention relates to a dose-measurement device for ion implantation, the device comprising a module CUR for estimating implantation current, a secondary electron detector DSE, and a control circuit CC for estimating the ion current by taking the difference between said implantation current and the current from said secondary electron detector. Furthermore, said high-energy secondary electron detector comprises a collector COL, P supporting exactly three mutually insulated electrodes: a first repulsion electrode G1, A1, T1 for repelling charges of a predetermined sign that are to be repelled, said electrode being provided with at least one orifice for passing electrons; a second repulsion electrode G2, A2, T2 for repelling charges of the opposite sign that are to be repelled, said electrode also being provided with at least one orifice for passing electrons; and a selection electrode G3, A3, T3, this electrode also being provided with at least one orifice for passing electrons.</p>
申请公布号 EP2577708(B1) 申请公布日期 2014.12.10
申请号 EP20110730719 申请日期 2011.06.01
申请人 ION BEAM SERVICES 发明人 TORREGROSA, FRANK;ROUX, LAURENT
分类号 H01J37/244;H01J37/32 主分类号 H01J37/244
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