发明名称 Circuit board inspection apparatus, circuit board inspection method and circuit board inspection tool
摘要 A circuit board inspection apparatus configured to perform electrical inspection of wiring patterns formed on a circuit board (90) with a built-in electronic component (95) is provided with a plurality of contactors (12), a switching circuit (20), and a controller (30). The controlling device (30) applies voltage by using a power supply (31) between a contactor (12a) and a contactor (12h) in a state a switch (SW1) of the switching circuit (20) is set to be ON and inspects an insulating state between two wiring patterns PT1 and PT2 corresponding to two inspection points (93a) and (93h) on the circuit board (90). At this time, if forward bias is applied to and forward current flows in diodes (21a) and (22h) inserted between the contactor (12a) and the contactor (12h) outside the circuit board (90), a potential difference between the contactors becomes equal to a potential difference VA2 between the diodes (21a) and (22h) and is limited to a relatively small value VL2.
申请公布号 EP2811303(A1) 申请公布日期 2014.12.10
申请号 EP20140170218 申请日期 2014.05.28
申请人 NIDEC-READ CORPORATION 发明人 YAMASHITA, MUNEHIRO
分类号 G01R1/067;G01R31/28 主分类号 G01R1/067
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