发明名称 METHOD FOR REMOVING A HIGH DEFINITION NANOSTRUCTURE, A PARTLY FREESTANDING LAYER, A SENSOR COMPRISING SAID LAYER AND A METHOD USING SAID SENSOR
摘要 <p>A method for removing a high definition nanostructure in a partly free-standing layer, the layer, a sensor comprising said layer, a use of said sensor, and a method of detecting a species, and optional further characteristics thereof, using said sensor. The sensor and method are suited for detecting single ions, molecules, low concentrations thereof, and identifying sequences of base pairs, e.g., in a DNA-strand.</p>
申请公布号 KR20140141628(A) 申请公布日期 2014.12.10
申请号 KR20147027733 申请日期 2013.03.04
申请人 TECHNISCHE UNIVERSITEIT DELFT 发明人 XU QIANG;SCHNEIDER GREGORY;ZANDBERGEN HENNY;WU MENGYUE;SONG BO;DE HEER CORNELIS DEKKER
分类号 G03F7/00;G01N33/487;G03F7/20;H01L29/16 主分类号 G03F7/00
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