ASSEMBLY FOR INTERFACING ELECTRIC SIGNAL AND

摘要

Disclosed are an assembly for interfacing an electric signal and an electric test device, capable of suppressing the delamination of a thin film resistor which is formed on one side of a substrate. The assembly for interfacing the electric signal includes a wiring line which interfaces the electric signal between a tester which determines the electric state of an object and a probe which is electrically connected to the object when the electric state of the object is tested, a resistance line which is continuously connected to the wiring line as a part of the wiring line and provides resistance on an electric signal line which is interfaced between the probe and the tester, and a protection member which covers the boundary region of the resistance line and the surface of the substrate on which the resistance line is formed.