发明名称 変形計測装置および変形計測方法
摘要 An apparatus and a method capable of measuring large deformation with a high accuracy and dynamically, using speckle interference, utilizes an optical path where one laser beam out of two laser beams becomes non-collimated light and a plane parallel transparent plate (21), and can form carrier fringes. More specifically, the transparent plate (21) is arranged on the optical path where the non-collimated light is formed, or is removed from the optical path, or a refractive index, or a thickness of the transparent plate arranged on the optical path, or a tilt angle relative to an optical axis is changed. The phase analysis can be performed from fringe images corresponding to the deformation, by performing repetitively the above-described processing and acquisition of the speckle interference pattern.
申请公布号 JP5637738(B2) 申请公布日期 2014.12.10
申请号 JP20100129275 申请日期 2010.06.04
申请人 发明人
分类号 G01B11/16;G01B11/24 主分类号 G01B11/16
代理机构 代理人
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