SCANNING PROBE MICROSCOPY WITH CALIBRATED FORCE CONSTANT AND CALIBRATING METHOD THEREOF

摘要

The present invention relates to a scanning probe microscopy to calibrate a constant force and a calibration method thereof. According to the present invention, a scanning probe microscopy comprises: a specimen fixing bracket having a specimen fixed thereon; a cantilever detector arranged on the upper side of the specimen fixing bracket having a probe; a calculation part calculating a constant force using the resonance frequency of the cantilever detector when the probe touches the specimen, wherein the constant force is capable of calibrating the size of a force applied to the specimen by the probe. According to the present invention, when a contact area between the probe and the specimen is applied as one of the main variables in a force-distance measurement performed for a unimolecular measurement by the scanning probe microscopy, the scanning probe microscopy is capable of calculating the force distance of the force applied to the specimen using the resonance frequency of the cantilever detector with the probe, and is capable of applying the constant force to the cantilever detector; thereby scanning the specimen more accurately.