发明名称 Semiconductor device and method of forming a shielding layer between stacked semiconductor die
摘要 A semiconductor device has a first semiconductor die with a shielding layer formed over its back surface. The first semiconductor die is mounted to a carrier. A first insulating layer is formed over the shielding layer. A second semiconductor die is mounted over the first semiconductor die separated by the shielding layer and first insulating layer. A second insulating layer is deposited over the first and second semiconductor die. A first interconnect structure is formed over the second semiconductor die and second insulating layer. A second interconnect structure is formed over the first semiconductor die and second insulating layer. The shielding layer is electrically connected to a low-impedance ground point through a bond wire, RDL, or TSV. The second semiconductor die may also have a shielding layer formed on its back surface. The semiconductor die are bonded through the metal-to-metal shielding layers.
申请公布号 US8907498(B2) 申请公布日期 2014.12.09
申请号 US201213691440 申请日期 2012.11.30
申请人 STATS ChipPAC, Ltd. 发明人 Pagaila Reza A.;Do Byung Tai;Suthiwongsunthorn Nathapong
分类号 H01L23/29;H01L23/552;H01L25/065;H01L25/00;H01L23/498;H01L23/538;H01L23/31;H01L21/56;H01L23/00 主分类号 H01L23/29
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A semiconductor device, comprising: a first semiconductor die; an electromagnetic interference (EMI) shielding layer formed directly on a surface of the first semiconductor die; a second semiconductor die disposed over the first semiconductor die and separated from the first semiconductor die by the EMI shielding layer; an encapsulant deposited around the first semiconductor die and second semiconductor die; and a first interconnect structure formed over the second semiconductor die and encapsulant.
地址 Singapore SG