发明名称 |
Encapsulating layer-covered semiconductor element, producing method thereof, and semiconductor device |
摘要 |
A method for producing an encapsulating layer-covered semiconductor element includes the steps of preparing a support sheet including a hard support board formed with a through hole passing through in a thickness direction and a pressure-sensitive adhesive layer laminated on a surface at one side in the thickness direction of the support board so as to cover the through hole; disposing a semiconductor element on a surface at one side in the thickness direction of the pressure-sensitive adhesive layer in opposed to the through hole in the thickness direction; covering the semiconductor element with an encapsulating layer to produce an encapsulating layer-covered semiconductor element; and inserting a pressing member into the through hole from the other side in the thickness direction to peel the encapsulating layer-covered semiconductor element from the pressure-sensitive adhesive layer. |
申请公布号 |
US8907502(B2) |
申请公布日期 |
2014.12.09 |
申请号 |
US201313914231 |
申请日期 |
2013.06.10 |
申请人 |
Nitto Denko Corporation |
发明人 |
Ebe Yuki;Katayama Hiroyuki;Kimura Ryuichi;Onishi Hidenori;Fuke Kazuhiro |
分类号 |
H01L33/52;H01L23/28;H01L21/56;H01L33/00 |
主分类号 |
H01L33/52 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. A method for producing an encapsulating layer-covered semiconductor element comprising:
a preparing step of preparing a support sheet including a hard support board formed with a through hole passing through an upper surface of the hard support board to a lower surface, and a pressure-sensitive adhesive layer laminated on the upper surface of the hard support board so as to cover the through hole; a semiconductor element disposing step of disposing a semiconductor element on an upper surface of the pressure-sensitive adhesive layer opposite the through hole; a semiconductor element covering step of covering the semiconductor element with an encapsulating layer to produce an encapsulating layer-covered semiconductor element including the semiconductor element and the encapsulating layer covering the semiconductor element; and a semiconductor element peeling step of inserting a pressing member into the through hole from the lower surface of the hard support board to press the pressure-sensitive adhesive layer corresponding to the through hole to relatively move the encapsulating layer-covered semiconductor element upward and peel the encapsulating layer-covered semiconductor element from the pressure-sensitive adhesive layer. |
地址 |
Osaka JP |