发明名称 Method of fabricating an interconnect device
摘要 An interconnect device and a method for fabricating same. An embodiment of the invention includes sequential steps of providing a flexible substrate, forming vias through the flexible substrate, applying a conductive seed layer including first and second portions, applying conductive materials including first and second portions, copper plating the substrate, and then removing the second portions of the conductive seed layer and the conductive materials.
申请公布号 US8904631(B2) 申请公布日期 2014.12.09
申请号 US201113087404 申请日期 2011.04.15
申请人 General Electric Company 发明人 Durocher Kevin Matthew;Burdick, Jr. William Edward;Plotnikov Yuru Alexeyevich;DeCrescente, Jr. David
分类号 H05K3/02;H05K3/10;H05K3/24;H05K3/42;H05K1/03;H05K3/40 主分类号 H05K3/02
代理机构 代理人 Dobson Melissa K.
主权项 1. A method for fabricating an interconnect device, consisting of the following in consecutive order: (a) providing a substrate; then (b) forming vias through the substrate; then (c) printing a patterned conductive seed layer onto the substrate; then (d) joining a primary conductor layer to the substrate; then (e) applying a covering over the primary conductor layer; and then (f) applying finish metal;wherein said step of joining a primary conductor layer to the substrate, the primary conductor layer is at a thickness range of about 10 μm to 80 μm; and wherein said step of printing said patterned conductive seed layer provides an electrical conductivity throughout the interconnect device greater than half the Q value of copper.
地址 Niskayuna NY US