发明名称 |
Method for extended diagnostic overlay control for tape storage devices |
摘要 |
According to one embodiment, a method includes monitoring a plurality of parameters relating to operation of a tape drive to collect data from the operation of the tape drive, receiving a specification of one or more user-specified parameters to log during one or more collection windows, wherein the one or more user-specified parameters are specified from the plurality of parameters, logging at least some of the data collected from the operation of the tape drive to a memory during the one or more collection windows, wherein the at least some of the data collected is stored in a tape map comprising a plurality of fields, the plurality of fields including at least one histogram field, at least one per-channel field, and at least one per-channel indicator field, and dynamically overlaying one or more fields from the plurality of fields with data collected from the one or more user-specified parameters. |
申请公布号 |
US8908486(B2) |
申请公布日期 |
2014.12.09 |
申请号 |
US201313757371 |
申请日期 |
2013.02.01 |
申请人 |
International Business Machines Corporation |
发明人 |
Butt Kevin D.;Gale Ernest S.;Nylander-Hill Pamela R. |
分类号 |
G11B27/36 |
主分类号 |
G11B27/36 |
代理机构 |
Zilka-Kotab, PC |
代理人 |
Zilka-Kotab, PC |
主权项 |
1. A method, comprising:
monitoring a plurality of parameters relating to operation of a tape drive to collect data from the operation of the tape drive; receiving a specification of one or more user-specified parameters to log during one or more collection windows, wherein the one or more user-specified parameters are specified from the plurality of parameters; logging at least some of the data collected from the operation of the tape drive to a memory during the one or more collection windows, wherein the at least some of the data collected is stored in a tape map comprising a plurality of fields, the plurality of fields comprising:
at least one histogram field;at least one per-channel field; andat least one per-channel indicator field; and dynamically overlaying one or more fields from the plurality of fields with data collected from the one or more user-specified parameters. |
地址 |
Armonk NY US |