发明名称 Method for extended diagnostic overlay control for tape storage devices
摘要 According to one embodiment, a method includes monitoring a plurality of parameters relating to operation of a tape drive to collect data from the operation of the tape drive, receiving a specification of one or more user-specified parameters to log during one or more collection windows, wherein the one or more user-specified parameters are specified from the plurality of parameters, logging at least some of the data collected from the operation of the tape drive to a memory during the one or more collection windows, wherein the at least some of the data collected is stored in a tape map comprising a plurality of fields, the plurality of fields including at least one histogram field, at least one per-channel field, and at least one per-channel indicator field, and dynamically overlaying one or more fields from the plurality of fields with data collected from the one or more user-specified parameters.
申请公布号 US8908486(B2) 申请公布日期 2014.12.09
申请号 US201313757371 申请日期 2013.02.01
申请人 International Business Machines Corporation 发明人 Butt Kevin D.;Gale Ernest S.;Nylander-Hill Pamela R.
分类号 G11B27/36 主分类号 G11B27/36
代理机构 Zilka-Kotab, PC 代理人 Zilka-Kotab, PC
主权项 1. A method, comprising: monitoring a plurality of parameters relating to operation of a tape drive to collect data from the operation of the tape drive; receiving a specification of one or more user-specified parameters to log during one or more collection windows, wherein the one or more user-specified parameters are specified from the plurality of parameters; logging at least some of the data collected from the operation of the tape drive to a memory during the one or more collection windows, wherein the at least some of the data collected is stored in a tape map comprising a plurality of fields, the plurality of fields comprising: at least one histogram field;at least one per-channel field; andat least one per-channel indicator field; and dynamically overlaying one or more fields from the plurality of fields with data collected from the one or more user-specified parameters.
地址 Armonk NY US