发明名称 |
Timing skew characterization apparatus and method |
摘要 |
A timing skew characterization apparatus comprises a coarse timing skew characterization circuit, a fine timing skew characterization circuit and a coarse delay cell calibration circuit. The coarse timing skew characterization circuit comprises a plurality of coarse delay cells whose delays can be calibrated through the coarse delay cell calibration circuit. The calibration of fine delay cells can be implemented through a trail and error process. Both coarse delay step and fine delay step can be characterized through a single measurement setup. As a result, the timing skew characterization apparatus provides a high resolution setup and hold time measurement. |
申请公布号 |
US8907681(B2) |
申请公布日期 |
2014.12.09 |
申请号 |
US201113046148 |
申请日期 |
2011.03.11 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chuang Chao Kai;Lai Yen-Chien;Liao Hung-Jen |
分类号 |
G04F10/00;G01R31/317;G01R31/319 |
主分类号 |
G04F10/00 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. An apparatus comprising:
a coarse timing skew characterization circuit having a buffer chain, a buffer of the buffer chain including a propagation delay; a coarse delay cell calibration circuit configured to measure a delay between an input of the buffer chain and an output of the buffer chain; and a fine timing skew characterization circuit connected between the coarse timing skew characterization circuit and a device-under-test (DUT), wherein a delay time of a fine delay step of the fine timing skew characterization circuit is determined based upon a setup and hold time of the DUT. |
地址 |
Hsin-Chu TW |