发明名称 Timing skew characterization apparatus and method
摘要 A timing skew characterization apparatus comprises a coarse timing skew characterization circuit, a fine timing skew characterization circuit and a coarse delay cell calibration circuit. The coarse timing skew characterization circuit comprises a plurality of coarse delay cells whose delays can be calibrated through the coarse delay cell calibration circuit. The calibration of fine delay cells can be implemented through a trail and error process. Both coarse delay step and fine delay step can be characterized through a single measurement setup. As a result, the timing skew characterization apparatus provides a high resolution setup and hold time measurement.
申请公布号 US8907681(B2) 申请公布日期 2014.12.09
申请号 US201113046148 申请日期 2011.03.11
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chuang Chao Kai;Lai Yen-Chien;Liao Hung-Jen
分类号 G04F10/00;G01R31/317;G01R31/319 主分类号 G04F10/00
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. An apparatus comprising: a coarse timing skew characterization circuit having a buffer chain, a buffer of the buffer chain including a propagation delay; a coarse delay cell calibration circuit configured to measure a delay between an input of the buffer chain and an output of the buffer chain; and a fine timing skew characterization circuit connected between the coarse timing skew characterization circuit and a device-under-test (DUT), wherein a delay time of a fine delay step of the fine timing skew characterization circuit is determined based upon a setup and hold time of the DUT.
地址 Hsin-Chu TW