发明名称 |
Semiconductor light emitting device and method for manufacturing the same |
摘要 |
A method for manufacturing a semiconductor light emitting device includes forming a lower cladding layer over a GaAs substrate; forming a quantum dot active layer over the lower cladding layer; forming a first semiconductor layer over the quantum dot active layer; forming a diffraction grating by etching the first semiconductor layer; forming a second semiconductor layer burying the diffraction grating; and forming an upper cladding layer having a conductive type different from that of the lower cladding layer over the second semiconductor layer, wherein the processes after forming the quantum dot active layer are performed at a temperature not thermally deteriorating or degrading quantum dots included in the quantum dot active layer. |
申请公布号 |
US8906721(B2) |
申请公布日期 |
2014.12.09 |
申请号 |
US201313898808 |
申请日期 |
2013.05.21 |
申请人 |
Fujitsu Limited;The University of Tokyo |
发明人 |
Hatori Nobuaki;Yamamoto Tsuyoshi;Matsuda Manabu;Arakawa Yasuhiko |
分类号 |
H01S5/12;B82Y20/00;H01S5/22;H01S5/34;H01L33/02;B82Y40/00;H01L33/30;H01S5/343;H01S5/042;H01S5/30 |
主分类号 |
H01S5/12 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. A method for manufacturing a semiconductor light emitting device comprising:
forming a lower cladding layer over a GaAs substrate; forming a quantum dot active layer over the lower cladding layer; forming an InGaP layer or an InGaAsP layer on an uppermost GaAs layer of the quantum dot active layer or on a first GaAs layer being formed over the quantum dot active layer; forming an InGaP diffraction grating or an InGaAsP diffraction grating which is the InGaP layer or the InGaAsP layer separated in a narrow line-shape by etching the InGaP layer or the InGaAsP layer periodically such that the uppermost GaAs layer or the first GaAs layer is exposed; forming a second GaAs layer burying the InGaP diffraction grating or the InGaAsP diffraction grating so as to be in contact with the uppermost GaAs layer or the first GaAs layer; and forming an upper cladding layer having a conductive type different from that of the lower cladding layer over the second GaAs layer, wherein the processes after the forming the quantum dot active layer are performed at a temperature not thermally deteriorating or degrading quantum dots included in the quantum dot active layer. |
地址 |
Kawasaki JP |