发明名称 |
Methods and systems for gain calibration of gamma ray detectors |
摘要 |
A method for gain calibration of a gamma ray detector includes measuring signals generated by one or more light sensors of a gamma ray detector, generating one or more derived curves using the measured signals as a function of bias voltage and identifying a transition point in the one or more derived curves. The method also includes determining a breakdown voltage of the one or more light sensors using the identified transition point and setting a bias of the one or more light sensors based on the determined breakdown voltage. |
申请公布号 |
US8907290(B2) |
申请公布日期 |
2014.12.09 |
申请号 |
US201213492439 |
申请日期 |
2012.06.08 |
申请人 |
General Electric Company |
发明人 |
Kim Chang Lyong;McDaniel David Leo;Malaney James Lindgren;Peterson William Todd;Tran Vi-Hoa;Wagadarikar Ashwin Ashok |
分类号 |
G01T1/24 |
主分类号 |
G01T1/24 |
代理机构 |
The Small Patent Law Group |
代理人 |
Small Dean D.;The Small Patent Law Group |
主权项 |
1. A method for calibrating a gamma ray detector, the method comprising:
measuring signals generated by one or more light sensors of a gamma ray detector; generating one or more derived curves using the measured signals as a function of bias voltage; identifying a transition point in the one or more derived curves, wherein the transition point corresponds to a switch from a horizontal portion to at least one of a curved portion or a vertical portion; determining an onset of a breakdown voltage of the one or more light sensors using the identified transition point; and setting a bias of the one or more light sensors at a predetermined value from the determined onset of the determined breakdown voltage. |
地址 |
Schenectady NY US |