发明名称 FABRICATION METHOD FOR SEMICONDUCTOR DEVICE INCLUDED GA
摘要 <p>A method for fabricating semiconductor device including Ga according to the present invention includes a step of preparing a substrate where a buffer layer and a gallium nitride layer are formed on a sapphire substrate; a step of performing a photoresist process for forming an ion injection layer in the active region of the substrate where the gallium nitride layer is grown; a step of forming an ion injection layer by injecting an Si ion to the active region exposed by the photoresist process; a step of forming a heat-treated protection layer on the substrate where the ion injection layer is formed; a step of performing a thermal process by emitting an infra-red ray and an ultraviolet ray after the heat-treated protection layer is formed; and a step of removing the heat-treated protection layer of the heat-treated substrate. In a thermal process of the substrate, an ultraviolet ray is emitted to improve the activation efficiency of ions injected into the substrate, thereby improving device properties and the productivity of a device manufacturing process.</p>
申请公布号 KR20140140887(A) 申请公布日期 2014.12.10
申请号 KR20130061866 申请日期 2013.05.30
申请人 INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY;SIGETRONICS INC. 发明人 YANG, JEON WOOK;SHIM, KYU HWAN;CHO, DEOK HO
分类号 H01L21/20;H01L21/265;H01L21/324;H01L29/78 主分类号 H01L21/20
代理机构 代理人
主权项
地址