| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical product capable of being used in a dark place deflection diopter measurement method for measuring deflection diopter in a dark place, the method can be easily executed in the dark place having change of an adjustment state.SOLUTION: The dark place deflection diopter measurement optical product is formed so that spectrum transmittance distribution is 10% or lower in a wavelength of 400 nm or more and 650 nm or less, and transmittances to the light in a wavelength of 530 nm and to the light in a wavelength of 560 nm become equal. In the dark place deflection diopter measurement method, using the dark place deflection diopter measurement optical product, measurements in non-subjective frequency are executed, for example a red green test. |
