发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a reduction in a withstand voltage of a high-frequency semiconductor switch.SOLUTION: A semiconductor device has a gate electrode, source regions and drain regions, a body-contact region, and a body-bias control electrode. The gate electrode is constituted from a plurality of first portions parallely disposed with a first distance and a second portion connecting the plurality of first portions, and is provided via a gate insulating film. The source regions and the drain regions are provided between the plurality of first portions. The body-contact region is disposed on the side of the second portion opposite to the side on which the source regions and the drain regions are provided. The body-bias control electrode is parallel to the second portion, is provided on the body-contact region, has a second distance between the body-bias control electrode and the second portion larger than the first distance, and is connected to the body-contact region.
申请公布号 JP2014229737(A) 申请公布日期 2014.12.08
申请号 JP20130108033 申请日期 2013.05.22
申请人 TOSHIBA CORP 发明人 SUGIURA MASAYUKI
分类号 H01L29/786;H01L29/41;H01L29/417 主分类号 H01L29/786
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