| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device which can suppress a difference in characteristics between in-test and in-use.SOLUTION: A semiconductor device of the present embodiment comprises: a semiconductor substrate 12; signal wiring 16 provided on the semiconductor substrate; and a pad 13 which includes a region 13a used for mounting and a region 13b used for testing, in which the regions 13a and 13b lie opposite to the signal wiring 16, the pad 13 connected with the signal wiring 16 by capacitive coupling. According to the present embodiment, a difference in characteristics can be suppressed.</p> |
