发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING DEVICE, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To form a thin film with excellent ashing resistance while maintaining high etching resistance.SOLUTION: A method for manufacturing a semiconductor device includes a step of forming a thin film containing silicon, oxygen, carbon, and a prescribed element of a group III element or a group V element on a substrate by performing, a prescribed number of times, a cycle including the steps of: supplying a material gas containing silicon, carbon, and a halogen element and having an Si-C bond and a catalyst gas to the substrate; supplying an oxidation gas and a catalyst gas to the substrate; and supplying a reformed gas containing the prescribed element to the substrate. |
申请公布号 |
JP2014229834(A) |
申请公布日期 |
2014.12.08 |
申请号 |
JP20130110242 |
申请日期 |
2013.05.24 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
SHIMAMOTO SATOSHI;HIROSE YOSHIRO;SANO ATSUSHI;KAMAKURA TSUKASA;NODA TAKAAKI |
分类号 |
H01L21/316;H01L21/283;H01L21/31;H01L21/768 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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