发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING DEVICE, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To form a thin film with excellent ashing resistance while maintaining high etching resistance.SOLUTION: A method for manufacturing a semiconductor device includes a step of forming a thin film containing silicon, oxygen, carbon, and a prescribed element of a group III element or a group V element on a substrate by performing, a prescribed number of times, a cycle including the steps of: supplying a material gas containing silicon, carbon, and a halogen element and having an Si-C bond and a catalyst gas to the substrate; supplying an oxidation gas and a catalyst gas to the substrate; and supplying a reformed gas containing the prescribed element to the substrate.
申请公布号 JP2014229834(A) 申请公布日期 2014.12.08
申请号 JP20130110242 申请日期 2013.05.24
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SHIMAMOTO SATOSHI;HIROSE YOSHIRO;SANO ATSUSHI;KAMAKURA TSUKASA;NODA TAKAAKI
分类号 H01L21/316;H01L21/283;H01L21/31;H01L21/768 主分类号 H01L21/316
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