发明名称 LITHOGRAPHY APPARATUS, LITHOGRAPHY METHOD, LITHOGRAPHY SYSTEM, AND METHOD OF MANUFACTURING ARTICLE
摘要 <p>PROBLEM TO BE SOLVED: To provide a lithography apparatus advantageous for forming a pattern on a substrate with high accuracy.SOLUTION: A lithography apparatus for patterning a substrate includes a first application unit for applying a first dose to a substrate on the basis of the data corresponding to the pattern, an acquisition unit for acquiring the information about the dimensional error of the pattern formed by application of the first dose by the first application unit, and a second application unit for applying a second dose to the substrate on the basis of the information about the error acquired in the acquisition unit.</p>
申请公布号 JP2014229802(A) 申请公布日期 2014.12.08
申请号 JP20130109390 申请日期 2013.05.23
申请人 CANON INC 发明人 FURUTOKU MASAFUMI;MIYASHITA TOMOYUKI;KINEBUCHI HIROMI
分类号 H01L21/027;G01B11/06;G03F7/20;H01L21/677 主分类号 H01L21/027
代理机构 代理人
主权项
地址