发明名称 INTEGRATED CIRCUIT CHIP AND MULTI CHIP SYSTEM INCLUDING THE SAME
摘要 An integrated circuit chip includes: a test circuit configured to perform a test operation and generate a test result signal indicating whether there is an error or not in the integrated circuit chip; and a transmitting unit configured to transmit the test result signal through an interlayer channel. The interlayer channel is precharged to a first level before the transmitting unit transmits the test result signal, and the transmitting unit drives the interlayer channel to a second level when the test result signal indicates that there is an error in the integrated circuit chip.
申请公布号 KR20140139788(A) 申请公布日期 2014.12.08
申请号 KR20130060307 申请日期 2013.05.28
申请人 SK HYNIX INC. 发明人 BYEON, SANG JIN
分类号 G11C29/08 主分类号 G11C29/08
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