| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a defect survey method of a structure capable of inspecting nondestructively, easily and quickly a defect generated in the structure.SOLUTION: A structure 31 is coated with an electromagnetic wave absorber for absorbing an electromagnetic wave having a specific frequency, and a coating part 40 of the electromagnetic wave absorber is irradiated with the electromagnetic wave having the specific frequency, and a difference of intensity of the electromagnetic wave having the specific frequency reflected from the coating part 40 of the electromagnetic wave absorber is measured, to thereby determine existence/absence of a defect of the structure 31.</p> |
