发明名称 MAIN ARRAY AND ECC ARRAY TEST METHOD FOR BUILT-IN ECC MEMORY
摘要 Disclosed is a memory which includes a main cell-array, an ECC cell-array, and an ECC encoder which generates ECC input data for a plurality of input data. The memory includes a write-multiplexer which selects a part or the entire of the input data and one of the ECC input data as the data to be written in the ECC cell-array.
申请公布号 KR20140139928(A) 申请公布日期 2014.12.08
申请号 KR20130060648 申请日期 2013.05.28
申请人 INDUSTRIAL BANK OF KOREA 发明人 KIM, YONG SOO
分类号 G11C29/42 主分类号 G11C29/42
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