| 摘要 |
<p>PROBLEM TO BE SOLVED: To enable the possibility of a fault to be evaluated by taking a temporary change of states of an electronic device into account.SOLUTION: An operation data analysis device as one embodiment of the present invention comprises: an explanatory variable calculation unit for calculating a plurality of explanatory variables on the basis of operation data of an electronic device, a period characteristic representing a yardstick for a period until the value of each of the plurality of explanatory variables changes, and operation data; a fault state information calculation unit for calculating fault state information about the electronic device on the basis of the plurality of explanatory variables calculated by the explanatory variable calculation unit, and, if the fault state information indicates a dangerous state, calculating a comprehensive period characteristic representing a yardstick for an approximate length of period in which the fault state information is likely to go to a safe state by a fluctuation in the values of the explanatory variables; and a diagnosis unit for diagnosing the electronic device on the basis of the fault state information and the comprehensive period characteristic.</p> |
