发明名称 BOARD INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection method in which the number of times inspection is made for a multi-end wiring pattern is reduced.SOLUTION: Provided is a board inspection method in which, when inspecting wiring patterns on a sheet board comprising a plurality of unit boards on which a plurality of multi-ended wiring patterns are formed, wiring patterns of two or more unit boards and a board inspection device for performing electrical inspection are connected, and determination is made as to whether the wiring patterns are good or bad, the board inspection method characterized in that a wiring pattern to be inspected which is formed on one unit board and a wiring pattern formed on another unit board which is formed the same way as the wiring pattern are selected, one discretionary end of one wiring pattern and one discretionary end of the other wiring pattern are electrically connected in order to have the one wiring pattern and the other wiring pattern short-circuited, and inspection for electrical continuity between an end other than the one discretionary end of the one wiring pattern and an end other than the one discretionary end of the other wiring pattern is carried out.
申请公布号 JP2014228301(A) 申请公布日期 2014.12.08
申请号 JP20130105984 申请日期 2013.05.20
申请人 NIDEC-READ CORP 发明人 YAMASHITA MUNEHIRO
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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