发明名称 TEST PROBE, TEST PROBE COMPONENT AND TEST PLATFORM
摘要 A test probe, a test probe component and a test platform. The test probe comprises a probe body (301), wherein an end of the probe body (301) is of a hollow design, thereby cooperating with a gold finger (40) through insertion. The design solves the current technical problems of assembly of a probe being relatively difficult, the processing requirements of a through-hole being relatively high, and powering on being unstable.
申请公布号 WO2014190894(A1) 申请公布日期 2014.12.04
申请号 WO2014CN78526 申请日期 2014.05.27
申请人 SHENZHEN CEWAY TECHNOLOGY CO., LTD 发明人 NIE, LINHONG
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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