发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
Provided are a semiconductor device and a method for fabricating the same. The method for fabricating a semiconductor device comprises, providing an active fin and a field insulating film including a first trench disposed on the active fin; forming a second trench through performing first etching of the field insulating film that is disposed on side walls and a lower portion of the first trench; forming a first region and a second region in the field insulating film through performing second etching of the field insulating film that is disposed on side walls and a lower portion of the second trench, the first region is disposed adjacent to the active fin and has a first thickness, and the second region is disposed spaced apart from the active fin as compared with the first region and has a second thickness that is thicker than the first thickness; and forming a gate structure on the active fin and the field insulating film. |
申请公布号 |
US2014357061(A1) |
申请公布日期 |
2014.12.04 |
申请号 |
US201414287240 |
申请日期 |
2014.05.27 |
申请人 |
Kim Sung-Min;Kang Ji-Su;Lee Dong-Kyu;Cha Dong-Ho |
发明人 |
Kim Sung-Min;Kang Ji-Su;Lee Dong-Kyu;Cha Dong-Ho |
分类号 |
H01L29/66 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor device, comprising:
providing an active fin and a field insulating film including a first trench on the active fin; etching portions of the field insulating film that define side walls of the first trench to form a second trench; etching a lower portion of the second trench so that a first region of the field insulating film that is disposed adjacent to the active fin has a first thickness, and a second region of the field insulating film that is spaced apart from the active fin as compared to the first region has a second thickness that is thicker than the first thickness; and forming a gate structure on the active fin and the field insulating film. |
地址 |
Incheon KR |