发明名称 SEMICONDUCTOR DEVICE HAVING INSULATING LAYERS CONTAINING OXYGEN AND A BARRIER LAYER CONTAINING MANGANESE
摘要 A semiconductor device includes an insulating layer formed over a semiconductor substrate, the insulating layer including oxygen, a first wire formed in the insulating layer, and a second wire formed in the insulating layer over the first wire and containing manganese, oxygen, and copper, the second wire having a projection portion formed in the insulating layer and extending downwardly but spaced apart from the first wire.
申请公布号 US2014353829(A1) 申请公布日期 2014.12.04
申请号 US201414459433 申请日期 2014.08.14
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 OCHIMIZU Hirosato;TSUKUNE Atsuhiro;KUDO Hiroshi
分类号 H01L23/532;H01L21/768;H01L23/522 主分类号 H01L23/532
代理机构 代理人
主权项 1. A semiconductor device comprising: an insulating layer formed over a semiconductor substrate, the insulating layer containing oxygen; a wire formed in the insulating layer, the wire containing copper; a structure formed in the wire, the structure containing oxygen; and an oxide layer formed between the wire and the structure, or between the wire and the insulating layer, the oxide layer containing manganese.
地址 Yokohama-shi JP