发明名称 |
SEMICONDUCTOR DEVICE HAVING INSULATING LAYERS CONTAINING OXYGEN AND A BARRIER LAYER CONTAINING MANGANESE |
摘要 |
A semiconductor device includes an insulating layer formed over a semiconductor substrate, the insulating layer including oxygen, a first wire formed in the insulating layer, and a second wire formed in the insulating layer over the first wire and containing manganese, oxygen, and copper, the second wire having a projection portion formed in the insulating layer and extending downwardly but spaced apart from the first wire. |
申请公布号 |
US2014353829(A1) |
申请公布日期 |
2014.12.04 |
申请号 |
US201414459433 |
申请日期 |
2014.08.14 |
申请人 |
FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
OCHIMIZU Hirosato;TSUKUNE Atsuhiro;KUDO Hiroshi |
分类号 |
H01L23/532;H01L21/768;H01L23/522 |
主分类号 |
H01L23/532 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
an insulating layer formed over a semiconductor substrate, the insulating layer containing oxygen; a wire formed in the insulating layer, the wire containing copper; a structure formed in the wire, the structure containing oxygen; and an oxide layer formed between the wire and the structure, or between the wire and the insulating layer, the oxide layer containing manganese. |
地址 |
Yokohama-shi JP |