发明名称 METHOD TO CO-INTEGRATE SiGe AND Si CHANNELS FOR FINFET DEVICES
摘要 A method for co-integrating finFETs of two semiconductor material types, e.g., Si and SiGe, on a bulk substrate is described. Fins for finFETs may be formed in an epitaxial layer of a first semiconductor type, and covered with an insulator. A portion of the fins may be removed to form voids in the insulator, and the voids may be filled by epitaxially growing a semiconductor material of a second type in the voids. The co-integrated finFETs may be formed at a same device level.
申请公布号 US2014353760(A1) 申请公布日期 2014.12.04
申请号 US201313907613 申请日期 2013.05.31
申请人 STMicroelectronics, Inc. 发明人 Loubet Nicolas;Khare Prasanna;Liu Qing
分类号 H01L21/8238;H01L27/092 主分类号 H01L21/8238
代理机构 代理人
主权项 1. A method for making co-integrated finFETs, the method comprising: forming a plurality of fins of a first semiconductor material for finFETs of a first type; removing a portion of the plurality of fins to form voids; and filling the voids with a second semiconductor material to form fins for finFETs of a second type.
地址 Coppell TX US