发明名称 Semiconductor Devices and Fabricating Methods Thereof
摘要 Provided are semiconductor devices and fabricating methods thereof. The semiconductor device includes a field insulating layer formed in a substrate, an interlayer dielectric layer formed on the field insulating layer and including a trench exposing at least a portion of the field insulating layer, a deposition insulating layer formed in the trench to be disposed on the field insulating layer, a gate insulating layer formed the trench to be disposed on the deposition insulating layer, and a metal gate formed the trench on the gate insulating layer.
申请公布号 US2014353719(A1) 申请公布日期 2014.12.04
申请号 US201414168028 申请日期 2014.01.30
申请人 Kim Ju-Youn 发明人 Kim Ju-Youn
分类号 H01L27/088;H01L29/78 主分类号 H01L27/088
代理机构 代理人
主权项 1. A semiconductor device comprising: a field insulating layer formed in a substrate; an interlayer dielectric layer on the field insulating layer and including a trench exposing at least a portion of the field insulating layer; a deposition insulating layer in the trench and on the portion of the field insulating layer; a gate insulating layer in the trench and on the deposition insulating layer therein; and a metal gate on the gate insulating layer in the trench.
地址 Suwon-si KR