发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 Provided are a semiconductor device including a high voltage transistor and a low voltage transistor and a method of manufacturing the same. The semiconductor device includes a semiconductor substrate including a high voltage region and a low voltage region; a high voltage transistor formed in the high voltage region and including a first active region, a first source/drain region, a first gate insulating layer, and a first gate electrode; and a low voltage transistor formed in the low voltage region and including a second active region, a second source/drain region, a second gate insulating layer, and a second gate electrode. The second source/drain region has a smaller thickness than a thickness of the first source/drain region.
申请公布号 US2014357035(A1) 申请公布日期 2014.12.04
申请号 US201414460081 申请日期 2014.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MAEDA Shigenobu;NOH Hyun-pil;LEE Choong-ho;HAM Seog-heon
分类号 H01L21/8236;H01L29/66;H01L21/8234;H01L27/088 主分类号 H01L21/8236
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, the method comprising: preparing a semiconductor substrate comprising a high voltage region and a low voltage region in which a first active region and a second active region are defined by a first isolation layer and a second isolation layer, respectively; forming a first gate insulating layer on the first active region and on the second active region; forming a first source/drain region in the first active region; and after the first source/drain region is formed, forming a second source/drain region having a smaller thickness than a thickness of the first source/drain region in the second active region.
地址 Suwon-si KR
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