发明名称 METHOD FOR 3D SUPER-RESOLUTION LOCALIZED MICROSCOPY
摘要 <p>PROBLEM TO BE SOLVED: To present a depth-resolution microscopy with which depth information not limited by whether or not fluorescent molecules are located within a predetermined depth range is determined within a wider depth range, and unnecessary irradiation of a fluorescent marker can be avoided as much as possible.SOLUTION: In a method for a 3D super-resolution localized microscopy, an excitation step and an imaging step are repeated multiple times to create a plurality of single images; from separated images of a light-emitting fluorescent marker, positional information on the respective corresponding fluorescent markers having the accuracy beyond optical resolution is determined in the plurality of created single images; the entire image with super resolution is created from thus determined positional information; a sample is irradiated with an excitation radiation as a first optical sheet 4, where the first optical sheet has intensity distribution asymmetric with respect to a focal plane along the imaging direction; the separated images of the light-emitting fluorescent marker are analyzed in terms of the contour 13 in the single images; and information on the distance of the corresponding fluorescent marker from the focal plane is derived from the contour.</p>
申请公布号 JP2014224814(A) 申请公布日期 2014.12.04
申请号 JP20140094231 申请日期 2014.04.30
申请人 CARL ZEISS MICROSCOPY GMBH 发明人 JOERG RITTER;JOERG SIEBENMORGEN;THOMAS KALKBRENNER
分类号 G01N21/64;G02B21/00;G02B21/36 主分类号 G01N21/64
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